Advances in x-ray analysis : proceedings of the twenty-first annual conference on applications of x-ray analysis held august 2-4, 1972 (R)

Contributor(s): | Birks, L. S...[et al.] | Birks, L. S...[et al.]Language: English Series: Publication details: New York ; Plenum Press ; 1973Edition: Description: v.16; 23 cmISBN: Subject(s): | X-rays-Industrial applications-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Reference Books Reference Books Central Library, IITB
548.73(058)Adv-16 Available C23A23 71954
Total holds: 0

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