Single event and radiation effects in deep-submicron CMOS technology (R)
Language: English Series: Publication details: Mumbai ; IIT ; 2004Edition: Description: x,76 p; 29.5 cmISBN: Subject(s): Vasi, J | Theses and Dissertations | Metal oxide semiconductors , Complementary , Metal oxide semiconductors field-effect transistors , Transistors-Effect of radiation| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Theses and Dissertations
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Central Library, IITB | 043:621.382.3:537.53Jai | Not for loan | D03B17 | 205485 |
Total holds: 0
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