Single event and radiation effects in deep-submicron CMOS technology (R)

Jain, Palkesh

Single event and radiation effects in deep-submicron CMOS technology (R) - - Mumbai IIT 2004 - x,76 p. 29.5 cm - .




Vasi, J.
Theses and Dissertations
Metal oxide semiconductors , Complementary , Metal oxide semiconductors field-effect transistors , Transistors-Effect of radiation

043:621.382.3:537.53Jai

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