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International test conference : testing in the 1980s : digest of papers, Philadelphia, Oct. 27-29, 1981

Institute of Electrical and Electronics Engineers

International test conference : testing in the 1980s : digest of papers, Philadelphia, Oct. 27-29, 1981 - - New York IEEE, 1981 - xxiv,568 p. 27cm - .

ISBN: 1

Subjects--Topical Terms:

Electronic-Testing-Congresses

Universal Decimal Class. No.: 621.372:621.382 Ins:81

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