Semiconductor devices measurements and tests / translated from the Russian by Alexander Repyev

By: Grin, GContributor(s): Language: English Series: Publication details: Moscow ; Mir Pub., ; 1980Edition: Description: 207 p; 20.5 cmISBN: 1Subject(s): | Semiconductors | Semiconductors-Testing
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area
621.382 Gri(2) Available C14A16 141108
Books Books Central Library, IITB
621.382 Gri Available G36B41 111477
Total holds: 0

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