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Semiconductor devices measurements and tests / translated from the Russian by Alexander Repyev

Grin, G.

Semiconductor devices measurements and tests / translated from the Russian by Alexander Repyev - - Moscow Mir Pub., 1980 - 207 p. 20.5 cm - .

ISBN: 1

Subjects--Topical Terms:

Semiconductors
Semiconductors-Testing

Universal Decimal Class. No.: 621.382 Gri

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