Semiconductor material and device characterization

By: Schroder, Dieter KContributor(s): Language: English Series: Publication details: New York ; Wiley Intersciece ; 1990Edition: Description: xv,599 p; 23.5 cmISBN: 0-471-51104-8Subject(s): | Semiconductors-Testing , Semiconductors
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
621.382Sch Available G37A08 160505
Total holds: 0

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