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Semiconductor material and device characterization

Schroder, Dieter K.

Semiconductor material and device characterization - - New York Wiley Intersciece 1990 - xv,599 p. 23.5 cm - .

ISBN: 0-471-51104-8

Subjects--Topical Terms:

Semiconductors-Testing , Semiconductors

Universal Decimal Class. No.: 621.382Sch

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