Effect of device dimensions, layout and technological parameters on the performance and reliability of Nano-scale HKMG transistors (R)

Duhan, Pardeep

Effect of device dimensions, layout and technological parameters on the performance and reliability of Nano-scale HKMG transistors (R) - Mumbai IIT 2017 - xviii,107 p. 30 cm

Thesis



Theses and Dissertations
Metal oxide semiconductor field-effect transistors
Nanotechnology
Gate array circuits--Materials
Nanostructure materials

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