| 000 | 00637 a2200277 4500 | ||
|---|---|---|---|
| 001 | 53296 | ||
| 020 | _a0-8186-9070-47 | ||
| 041 | _aeng | ||
| 080 | _a621.372:621.382 Mau | ||
| 245 | _aTest access port and boundary scan architecture | ||
| 250 | _a | ||
| 260 | _aWashington | ||
| 260 | _bIEEE Computer Society Press, | ||
| 260 | _c1990 | ||
| 300 | _axxii,372 p. | ||
| 300 | _c27.5 cm | ||
| 490 | _a | ||
| 100 | _aMaunder, Colin M. | ||
| 700 | _aTulloss, Rodham E. | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aElectronic circuits - Testing- Data processing | ||
| 650 | _aComputer architecture | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c92661 _d92661 |
||