| 000 | 00688 a2200277 4500 | ||
|---|---|---|---|
| 001 | 52165 | ||
| 020 | _a0 | ||
| 041 | _aeng | ||
| 080 | _a621.382:536.5 Ins:6:90 | ||
| 245 | _aSemiconductor thermal and temperature measurement symposium, 6th, Scottsdale, AZ, USA, Feb. 6-8, 1990 | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bIEEE, | ||
| 260 | _c1990 | ||
| 300 | _axiv,146 p. | ||
| 300 | _c27 cm | ||
| 490 | _a | ||
| 100 | _aInstitute of Electrical and Electronics Engineers | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aSemiconductors-Congresses | ||
| 650 | _aThermal electrons-Congresses | ||
| 650 | _aTemperature measurements-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c86638 _d86639 |
||