| 000 | 00561 a2200253 4500 | ||
|---|---|---|---|
| 001 | 6152 | ||
| 020 | _a0-306-40293-91 | ||
| 041 | _aeng | ||
| 080 | _a621.382:620.179.1 Non:78 | ||
| 245 | _aNondestructive evaluation of semiconductor materials and devices / edited by Jay N. Zemel | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bPlenum Press, | ||
| 260 | _c1979 | ||
| 300 | _axi,782 p. | ||
| 300 | _c24.5 cm | ||
| 490 | _a | ||
| 100 | _a | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aSemiconductors-Testing congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c7587 _d7587 |
||