| 000 | 00571 a2200253 4500 | ||
|---|---|---|---|
| 001 | 24867 | ||
| 020 | _a3-540-13359-30 | ||
| 041 | _aeng | ||
| 080 | _a539.26 Was | ||
| 245 | _aNovel application of anomalous (resonance) x-ray scattering for structural characterization of disordered materials | ||
| 250 | _a | ||
| 260 | _aBerlin | ||
| 260 | _bSpringer-Verlag, | ||
| 260 | _c1984 | ||
| 300 | _avi,183 p. | ||
| 300 | _c24 cm | ||
| 490 | _a | ||
| 100 | _aWaseda, Yoshio | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aX-rays-Scattering | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c48195 _d48195 |
||