| 000 | 00660 a2200265 4500 | ||
|---|---|---|---|
| 001 | 43332 | ||
| 020 | _a0-931837-47-20 | ||
| 041 | _aeng | ||
| 080 | _a620.1 Cha:86 | ||
| 245 | _aCharacterization of defects in materials : symposium, Boston, Dec.1-2, 1986 / edited by Richard W. Siegel, Julia R. Weertman and Robert Sinclair | ||
| 250 | _a | ||
| 260 | _aPittsburgh | ||
| 260 | _bMaterials Research Society, | ||
| 260 | _c1987 | ||
| 300 | _axv,532 p. | ||
| 300 | _c22.5 cm | ||
| 490 | _a | ||
| 100 | _a | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aMaterials-Defects-Congresses | ||
| 650 | _aCrystals-Defects-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c40761 _d40761 |
||