| 000 | 00639 a2200265 4500 | ||
|---|---|---|---|
| 001 | 42933 | ||
| 020 | _a0 | ||
| 041 | _aeng | ||
| 080 | _a621.382:536.5 Ins:4:88 | ||
| 245 | _aSemiconductor thermal and temperature measurement symposium, 4th, San Diego, CA, USA, Feb. 10-12, 1988 | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bIEEE, | ||
| 260 | _c1988 | ||
| 300 | _a158 p. | ||
| 300 | _c27 cm | ||
| 490 | _a | ||
| 100 | _aInstitute of Electrical and Electronics Engineers | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aSemicondutors-Congresses | ||
| 650 | _aTemperature measurements-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c38749 _d38749 |
||