| 000 | 00695 a2200241 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20240207124915.0 | ||
| 008 | 240207b |||||||| |||| 00| 0 eng d | ||
| 020 | _a978-0-387-25800-3 | ||
| 040 | _cIITB | ||
| 041 | _aeng | ||
| 080 |
_a620.186/.187 _bEge |
||
| 100 |
_aEgerton, Ray F _954089 _eAuthor |
||
| 245 | _aPhysical principles of electron microscopy : an introduction to TEM, SEM, and AEM | ||
| 260 |
_aNew York _bSpringer _c2005 |
||
| 300 |
_axii,202 p. _c24 cm |
||
| 650 |
_aMaterials science _9372 |
||
| 650 |
_aMicroscopy _92830 |
||
| 650 | 0 |
_911118 _aElectron microscopy |
|
| 650 | 0 |
_94499 _aNanotechnology |
|
| 650 | 0 |
_932995 _aSpectroscopy |
|
| 942 |
_2udc _cBK |
||
| 999 |
_c297928 _d297928 |
||