| 000 | 00539 a2200265 4500 | ||
|---|---|---|---|
| 001 | 62600 | ||
| 020 | _a0-8247-8932-61 | ||
| 041 | _aeng | ||
| 080 | _a620.l79.1 Spe | ||
| 245 | _aSpeckle metrology / edited by Rajpal S. Sirohi | ||
| 250 | _a | ||
| 260 | _a | ||
| 260 | _bNew York : Marcel Dekker, 1993 | ||
| 260 | _c1993 | ||
| 300 | _axiii,551 p. | ||
| 300 | _c22 cm | ||
| 490 | _a | ||
| 100 | _a | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aNon-destructive testing | ||
| 650 | _aSpeckle metrology | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c29039 _d29039 |
||