| 000 | 00952nam a22002657a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230603120801.0 | ||
| 008 | 191231b xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIITB | ||
| 041 | _aeng | ||
| 080 |
_a043:621.382:681.3.07 _bDas |
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| 100 |
_aDas, Bhaskar _913295 _eAuthor |
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| 245 | _aSub-Bandgap impact ionization in Si NIPIN selector diode and its applications (R) | ||
| 260 |
_aMumbai _bIIT _c2018 |
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| 300 |
_axxiii,143 p. _c30 cm |
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| 502 | _cIndian Institute of Technology Bombay. Department of Electrical Engineering | ||
| 650 | 0 |
_aTheses and Dissertations _921 |
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| 650 | 0 |
_9240 _aSemiconductor storage devices |
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| 650 | 0 |
_aRandom Access Memory (RAM) _913856 |
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| 650 | 0 |
_93219 _aSemiconductor devices |
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| 700 |
_aGanguly, Udayan _eSupervisor _913296 |
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| 700 |
_aLodha, Saurabh _eSupervisor _9874 |
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| 710 |
_aIndian Institute of Technology Bombay. _bDepartment of Electrical Engineering _964 |
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| 942 |
_2udc _cTD |
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| 999 |
_c276764 _d276764 |
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