000 00522 a2200253 4500
001 40136
020 _a1
041 _aeng
080 _a621.382 Hol
245 _aStudies of electrical breakdown in thin films of silicon dioxide
250 _a
260 _aBerkeley
260 _bUniversity of California,
260 _c1986
300 _a99 p.
300 _c21 cm
490 _a
100 _aHolland, Stephen Edward
700 _a
650 _a
650 _aSilicon Dioxide
942 _cBK
942 _2UDC
999 _c26426
_d26426