000 00569 a2200241 4500
001 306027
020 _a
041 _aeng
080 _aLNBS SMT SP - 400 - 24 : 1974
245 _aLaser Scanner for semiconductor devices
250 _a
260 _aWashington, D.C.
260 _bNBS
260 _c1977
300 _a72 p.
300 _c
856 _uNBS
490 _aNBS SMT SP - 400 - 24 : 1974
700 _a
650 _a
650 _aElectronic reliability, Electronics, Laser scanner, Measurement method, Semiconductor device studies
942 _cPP
942 _2UDC
999 _c254545
_d254545