000 | 00569 a2200241 4500 | ||
---|---|---|---|
001 | 306027 | ||
020 | _a | ||
041 | _aeng | ||
080 | _aLNBS SMT SP - 400 - 24 : 1974 | ||
245 | _aLaser Scanner for semiconductor devices | ||
250 | _a | ||
260 | _aWashington, D.C. | ||
260 | _bNBS | ||
260 | _c1977 | ||
300 | _a72 p. | ||
300 | _c | ||
856 | _uNBS | ||
490 | _aNBS SMT SP - 400 - 24 : 1974 | ||
700 | _a | ||
650 | _a | ||
650 | _aElectronic reliability, Electronics, Laser scanner, Measurement method, Semiconductor device studies | ||
942 | _cPP | ||
942 | _2UDC | ||
999 |
_c254545 _d254545 |