| 000 | 00567 a2200241 4500 | ||
|---|---|---|---|
| 001 | 306026 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _aLNBS SMT SP - 400 - 27 : 1974 | ||
| 245 | _aLaser scanning of active semiconductor devices | ||
| 250 | _a | ||
| 260 | _aIllinois | ||
| 260 | _bNational Bureau of standards | ||
| 260 | _c1976 | ||
| 300 | _a26 p. | ||
| 300 | _c | ||
| 856 | _uNBS | ||
| 490 | _aNBS SMT SP - 400 - 27 : 1974 | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aFailure analysis, Hot spots, Integrated circuits, Reliability, Transistors | ||
| 942 | _cPP | ||
| 942 | _2UDC | ||
| 999 |
_c254543 _d254543 |
||