| 000 | 00558 a2200277 4500 | ||
|---|---|---|---|
| 001 | 19917 | ||
| 020 | _a3 | ||
| 041 | _aeng | ||
| 080 | _a537.311.33 Lan-2 | ||
| 245 | _aPoint defects in semiconductors : experrmental aspects | ||
| 250 | _a | ||
| 260 | _aBerlin | ||
| 260 | _bSpringer-Verlag, | ||
| 260 | _c1983 | ||
| 300 | _apt.2 | ||
| 300 | _c23 cm | ||
| 490 | _a | ||
| 100 | _aBourgoin, J. | ||
| 700 | _aLannoo, M. | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aSemiconductors-Defects | ||
| 650 | _aPoint defects | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c24691 _d24691 |
||