| 000 | 00526 a2200253 4500 | ||
|---|---|---|---|
| 001 | 197 | ||
| 020 | _a1 | ||
| 041 | _aeng | ||
| 080 | _a621.382.3 Pro:56 | ||
| 245 | _aProceedings of the transistor reliability symposium, New York, Sept. 17-18, 1956 | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bNew York University Press, | ||
| 260 | _c1958 | ||
| 300 | _a128 p. | ||
| 300 | _c27 cm | ||
| 490 | _a | ||
| 100 | _a | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aTransistor-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c242 _d242 |
||