| 000 | 00763 a2200289 4500 | ||
|---|---|---|---|
| 001 | 39290 | ||
| 020 | _a0931837-06-50 | ||
| 041 | _aeng | ||
| 080 | _a548.4:539.12 Adv:84 | ||
| 245 | _aAdvanced photon and particle techniques for the characterization of defects in solids : symposium, Boston, Nov. 27-29, 1984 / edited by J.B. Roberto, R.W. Carpenter and M.C. Wittels | ||
| 250 | _a | ||
| 260 | _aPittsburg | ||
| 260 | _bMRS, | ||
| 260 | _c1985 | ||
| 300 | _axi,388 p. | ||
| 300 | _c22.5 cm | ||
| 490 | _a | ||
| 100 | _a | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aCrystals-Defects-Congresses | ||
| 650 | _aElectron microscopy-Congresses | ||
| 650 | _aPhoton beams-Congresses | ||
| 650 | _aPartical beams-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c23711 _d23711 |
||