| 000 | 00696 a2200265 4500 | ||
|---|---|---|---|
| 001 | 349263 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:669.4:539.23Tan | ||
| 245 | _aGrowth and dielectric characterization of lead magnesium niobate thin films using R-F magnetron sputtering (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2003 | ||
| 300 | _aix,66 p. | ||
| 300 | _c29 cm | ||
| 490 | _a | ||
| 100 | _aTandon, Nipun | ||
| 700 | _aKulkarni, A.R. and Venkataramani, N. | ||
| 650 | _aKulkarni, A.R. and Venkataramani, N. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aLead magnesium nibonate , Thin film , Dielectric films | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c233087 _d233086 |
||