| 000 | 00570 a2200265 4500 | ||
|---|---|---|---|
| 001 | 348310 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:658.562:621.372Sav | ||
| 245 | _aReliability and yield estimation in circuit design (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2002 | ||
| 300 | _aiv,52 p. | ||
| 300 | _c30 cm | ||
| 490 | _a | ||
| 100 | _aSavant, S.V. | ||
| 700 | _aVerma, A. K. | ||
| 650 | _aVerma, A. K. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aIntegrated circuits-Reliability | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c232819 _d232819 |
||