| 000 | 00604 a2200265 4500 | ||
|---|---|---|---|
| 001 | 331515 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.382Pat | ||
| 245 | _aStudy of defect states in silicon carbide (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2011 | ||
| 300 | _axxii,168 p. | ||
| 300 | _c30 cm | ||
| 490 | _a | ||
| 100 | _aPatnaik, Padmaja | ||
| 700 | _aMukhopadhyay, G. ; Singh, P.P. | ||
| 650 | _aMukhopadhyay, G. ; Singh, P.P. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aSemiconductor devices , Silicon carbide | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c219446 _d219446 |
||