| 000 | 00552 a2200265 4500 | ||
|---|---|---|---|
| 001 | 299908 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.372:621.382Rav | ||
| 245 | _aVLSI testing : computer based test generation techniques (R) | ||
| 250 | _a | ||
| 260 | _aBombay | ||
| 260 | _bIIT | ||
| 260 | _c1984 | ||
| 300 | _a129 p. | ||
| 300 | _c30 cm | ||
| 490 | _a | ||
| 100 | _aRavindran, R. | ||
| 700 | _aIsaac,J.R. | ||
| 650 | _aIsaac,J.R. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aVLSI circuits | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c213507 _d213507 |
||