| 000 | 00631 a2200265 4500 | ||
|---|---|---|---|
| 001 | 253362 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.382:519.3Red | ||
| 245 | _aAggressive memory testing (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2008 | ||
| 300 | _avii,79 p. | ||
| 300 | _c30 cm | ||
| 490 | _a | ||
| 100 | _aReddy, K. Shailender | ||
| 700 | _aChandorkar, A.N. and Parekhji, R.A. | ||
| 650 | _aChandorkar, A.N. and Parekhji, R.A. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aSemiconductors-Reliability , Semiconductors-Testing , Algorithms | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c203052 _d203052 |
||