| 000 | 00622 a2200265 4500 | ||
|---|---|---|---|
| 001 | 243222 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.382:519.28Rav | ||
| 245 | _aArea defects and their effect on yield and reliability (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2003 | ||
| 300 | _av,52 p. | ||
| 300 | _c30 cm | ||
| 490 | _a | ||
| 100 | _aRavindra Readdy Sabbella | ||
| 700 | _aApte, Prakash R. | ||
| 650 | _aApte, Prakash R. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aIntegrated circuits-Reliability , Integrated circuits-Defects | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c200249 _d200249 |
||