| 000 | 00610 a2200265 4500 | ||
|---|---|---|---|
| 001 | 17685 | ||
| 020 | _a0-306-40628-41 | ||
| 041 | _aeng | ||
| 080 | _a548.4 Cha:79 | ||
| 245 | _aCharacterization of crystal growth decects by x-ray methods / edited by Brian K. Tanner and D. Keith Bowen | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bPlenum Press, | ||
| 260 | _c1980 | ||
| 300 | _axxvi,589 p. | ||
| 300 | _c25 cm | ||
| 490 | _a | ||
| 100 | _a | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aCrystals-Defects-Congresses | ||
| 650 | _aX-ray crystallography-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c19911 _d19911 |
||