| 000 | 00617 a2200265 4500 | ||
|---|---|---|---|
| 001 | 239344 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.382:681.3.06Ran | ||
| 245 | _aSemiconductor memory testing (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2006 | ||
| 300 | _avi,62 p. | ||
| 300 | _c30 cm | ||
| 490 | _a | ||
| 100 | _aRane, Narendra | ||
| 700 | _aChandorkar, A.N. | ||
| 650 | _aChandorkar, A.N. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aSemiconductors , Semiconductors-Testing , Random access memory-Testing , Microelectronics | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c198842 _d198842 |
||