| 000 | 00917 a2200277 4500 | ||
|---|---|---|---|
| 001 | 228677 | ||
| 003 | OSt | ||
| 005 | 20230506160904.0 | ||
| 008 | 230506b |||||||| |||| 00| 0 eng d | ||
| 040 | _cIITB | ||
| 041 | _aeng | ||
| 080 |
_a043:621.382:669.782 _bBha |
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| 100 |
_aBharath Kumar P. _eAuthor _948048 |
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| 245 | _aReliability studies in SONOS flash EEPROMs (R) | ||
| 260 |
_aBombay _c2006 _bIIT |
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| 300 | _axv,120 p. | ||
| 300 | _c30 cm | ||
| 502 |
_aThesis _bPh.D _cIndian Institute of Technology Bombay. Department of Electrical Engineering _d2006 |
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| 650 |
_aMahapatra, S. _947303 |
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| 650 |
_aTheses and Dissertations _921 |
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| 650 |
_aSemiconductor storage devices-Reliability _948049 |
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| 650 |
_a Silicon nitride _9387 |
||
| 700 |
_aMahapatra, S. _eSupervisor _946836 |
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| 710 |
_aIndian Institute of Technology Bombay _bDepartment of Electrical Engineering _964 |
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| 942 |
_cTD _2udc |
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| 999 |
_c196373 _d196373 |
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