000 00520 a2200253 4500
001 317044
020 _a
041 _aeng
080 _a621.385.832:681.3Dud
245 _aPattern classification and scene analysis
250 _a
260 _aNew York
260 _bJohn Wiley
260 _c1973
300 _axvii,482 p.
300 _c23 cm
490 _a
700 _a
650 _a
650 _aElectronics
650 _aPattern recognition systems , Statistical decision
942 _cBC
942 _2UDC
999 _c188173
_d188173