| 000 | 00650 a2200265 4500 | ||
|---|---|---|---|
| 001 | 95102 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.382:519.28Lok | ||
| 245 | _aBIST enhancements for memory test and repair (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2004 | ||
| 300 | _aiv,45 p. | ||
| 300 | _c29.5 cm | ||
| 490 | _a | ||
| 100 | _aLokhande, Kiran R. | ||
| 700 | _aChandorkar, A.N. and Parekhji, R.A. | ||
| 650 | _aChandorkar, A.N. and Parekhji, R.A. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aIntegrated circuits-Testing , Dynamic testing-Mathematical models | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c184595 _d184595 |
||