| 000 | 00611 a2200265 4500 | ||
|---|---|---|---|
| 001 | 83868 | ||
| 020 | _a | ||
| 041 | _aeng | ||
| 080 | _a043:621.372:621.382Tit | ||
| 245 | _aESD failure estimation of CMOS ICs (R) | ||
| 250 | _a | ||
| 260 | _aMumbai | ||
| 260 | _bIIT | ||
| 260 | _c2001 | ||
| 300 | _aiv,44 p. | ||
| 300 | _c29.5 cm | ||
| 490 | _a | ||
| 100 | _aTitre, Ravi | ||
| 700 | _aChandorkar, A.N. | ||
| 650 | _aChandorkar, A.N. | ||
| 650 | _aTheses and Dissertations | ||
| 650 | _aElectrostatics , Metal oxide semiconductors, Complimentary , Integrated circuits | ||
| 942 | _cTD | ||
| 942 | _2UDC | ||
| 999 |
_c178570 _d178570 |
||