| 000 | 00885 a2200265 4500 | ||
|---|---|---|---|
| 001 | 44074 | ||
| 003 | OSt | ||
| 005 | 20230429133732.0 | ||
| 008 | 230429b |||||||| |||| 00| 0 eng d | ||
| 020 | _a0 | ||
| 040 | _cIITB | ||
| 041 | _aeng | ||
| 080 |
_a043:621.372:621.382 _bShe |
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| 100 |
_aSherlekar S.D. _eAuthor _946421 |
||
| 245 | _aStudies in testing of transistor stuck-open faults in combinational CMOS circuits (R) | ||
| 260 |
_aBombay _bIIT _c1987 |
||
| 300 |
_axi, 135 p. _c27 cm |
||
| 502 |
_aThesis
_bPh.D. _cIndian Institute of Technology Bombay. Department of Electrical Engineering _d1987 |
||
| 650 | 0 |
_aTheses and Dissertations _921 |
|
| 650 | 0 |
_aVLSI circuits _99748 |
|
| 650 |
_aTesting _947343 |
||
| 700 |
_aVasi, J. _eSupervisor _947339 |
||
| 710 |
_964 _aIndian Institute of Technology Bombay. _bDepartment of Electrical Engineering |
||
| 942 |
_cTD _2udc |
||
| 999 |
_c166670 _d166670 |
||