| 000 | 00702 a2200265 4500 | ||
|---|---|---|---|
| 001 | 350731 | ||
| 020 | _a978-3-642-27380-3 | ||
| 041 | _aeng | ||
| 080 | _a535.33:539.12Hof | ||
| 245 | _aAuger- and X-Ray photoelectron spectroscopy in materials science : a user-oriented guide | ||
| 250 | _a | ||
| 260 | _aBerlin | ||
| 260 | _bSpringer | ||
| 260 | _c2013 | ||
| 300 | _axix,528 p. | ||
| 300 | _c24 cm | ||
| 490 | _aSpringer series in surface sciences ; 49 | ||
| 100 | _aHofmann, Siegfried | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aPhysics | ||
| 650 | _aX-ray photoelectron spectroscopy , Auger electron spectroscopy , Auger effect , Surfaces(Physics)-Analysis | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c157732 _d157732 |
||