| 000 | 00616 a2200289 4500 | ||
|---|---|---|---|
| 001 | 251992 | ||
| 020 | _a978-0-387-29260-1 | ||
| 041 | _aeng | ||
| 080 | _a539.23Alf | ||
| 245 | _aFundamentals of nanoscale film analysis | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bSpringer | ||
| 260 | _c2007 | ||
| 300 | _axiv,336 p. | ||
| 300 | _c24 cm | ||
| 490 | _a | ||
| 100 | _aAlford, Terry L. | ||
| 700 | _aFeldman, Leonard C. | ||
| 700 | _aMayer, James W. | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aPhysics | ||
| 650 | _aThin films , Nanomaterials , Thin films analysis | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c147307 _d147307 |
||