| 000 | 00648 a2200277 4500 | ||
|---|---|---|---|
| 001 | 244833 | ||
| 020 | _a978-0-521-83199-4 | ||
| 041 | _aeng | ||
| 080 | _a620.168:537.533.72Foc | ||
| 245 | _aFocused ion beam systems : basics and applications | ||
| 250 | _a | ||
| 260 | _aCambridge | ||
| 260 | _bCambridge University Press | ||
| 260 | _c2007 | ||
| 300 | _axi,395 p. | ||
| 300 | _c25.5 cm | ||
| 490 | _a | ||
| 700 | _a | ||
| 700 | _aYao, Nan | ||
| 700 | _aYao, Nan | ||
| 650 | _a | ||
| 650 | _aMaterial Testing | ||
| 650 | _aFocused ion beams , Focused ion beams-Industrial applications , Ion bombardment | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c144876 _d144876 |
||