| 000 | 00543 a2200265 4500 | ||
|---|---|---|---|
| 001 | 11514 | ||
| 020 | _a0-471-07817-49 | ||
| 041 | _aeng | ||
| 080 | _a537.311.3 Rav | ||
| 245 | _aImperfections and impurities in semiconductor silicon | ||
| 250 | _a | ||
| 260 | _aNew York | ||
| 260 | _bJohn Wiley, | ||
| 260 | _c1981 | ||
| 300 | _axiv,379 p. | ||
| 300 | _c23 cm | ||
| 490 | _a | ||
| 100 | _aRavi, K.V. | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aSilicon-Defects | ||
| 650 | _aSemiconductors-Defects | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c13393 _d13393 |
||