| 000 | 00707 a2200265 4500 | ||
|---|---|---|---|
| 001 | 112379 | ||
| 020 | _a0 | ||
| 041 | _aeng | ||
| 080 | _a620.1:061.2 Ame:69:66 | ||
| 245 | _aMeasurement of dielectric properties under space conditions : a symposium : 69th annual meeting, Atlantic city, New Jersey, 26 June-1 July, 1966 | ||
| 250 | _a | ||
| 260 | _aPhiladelphia | ||
| 260 | _bASTM, | ||
| 260 | _c1967 | ||
| 300 | _a100 p. | ||
| 300 | _c23 cm | ||
| 490 | _aBSI 8207 : 1985 | ||
| 100 | _aAmerican Society for Testing and Materials | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aDielectrics-Congresses | ||
| 650 | _aMaterials-Effect of space environment on-Congresses | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c132955 _d132955 |
||