| 000 | 00560 a2200265 4500 | ||
|---|---|---|---|
| 001 | 10753 | ||
| 020 | _a1 | ||
| 041 | _aeng | ||
| 080 | _a621.382 Gri | ||
| 245 | _aSemiconductor devices measurements and tests / translated from the Russian by Alexander Repyev | ||
| 250 | _a | ||
| 260 | _aMoscow | ||
| 260 | _bMir Pub., | ||
| 260 | _c1980 | ||
| 300 | _a207 p. | ||
| 300 | _c20.5 cm | ||
| 490 | _a | ||
| 100 | _aGrin, G. | ||
| 700 | _a | ||
| 650 | _a | ||
| 650 | _aSemiconductors | ||
| 650 | _aSemiconductors-Testing | ||
| 942 | _cBK | ||
| 942 | _2UDC | ||
| 999 |
_c12666 _d12666 |
||