000 00605 a2200277 4500
001 149330
020 _a0
041 _aeng
080 _a546.28:548.73 Gaz
245 _aQuantitative determination of phase content of silicon nitride by x-ray diffraction analysis
250 _a
260 _aMassachusetts
260 _bAMMRC,
260 _c1975
300 _a14 p.
300 _c27 cm
490 _a
100 _aGazzara, Charles P.
700 _aMessier, Donald R.
700 _a
650 _a
650 _aSilicon nitride
650 _aX-ray analysis
942 _cBK
942 _2UDC
999 _c121041
_d121041