000 00558 a2200253 4500
001 56895
020 _a0-12-734580-911
041 _aeng
080 _a621.374.32:681.3 Wan
245 _aDigital circuit testing : a guide to DFT and other techniques
250 _a
260 _a
260 _bSan Diego : Academic Press, 1991
260 _c1991
300 _axi,233 p.
300 _c22.5 cm
490 _a
100 _aWang, Francis C.
700 _a
650 _a
650 _aDigital integrated circuits-Testing
942 _cBK
942 _2UDC
999 _c111349
_d111349