Semiconductor memory testing (R)
Language: English Series: Publication details: Mumbai ; IIT ; 2006Edition: Description: vi,62 p; 30 cmISBN: Subject(s): Chandorkar, A.N | Theses and Dissertations | Semiconductors , Semiconductors-Testing , Random access memory-Testing , Microelectronics| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Theses and Dissertations
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Central Library, IITB | 043:621.382:681.3.06Sha | Not for loan | D03B28 | 224711 | ||
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Theses and Dissertations
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Central Library, IITB | 043:621.382:681.3.06Ran | Not for loan | D03B22 | 216115 |
Total holds: 0
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