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Introduction to mixed-signal IC test and measurement

by Burns, Mark | Roberts, Gordon W | .

Series: Edition: Language: English Publication details: New York ; Oxford University Press, ; 2001Availability: Items available for loan: 1 Call number: 621.372:621.382 Bur.

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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

by Bushnell, Michael L | Agrawal, Vishwani D | .

Series: Edition: Language: English Publication details: Boston ; Kluwer Academic Pub., ; 2000Availability: Items available for loan: 1 Call number: 621.372:621.382 Bus.
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