Focused ion beam systems : basics and applications

Contributor(s): | Yao, Nan | Yao, NanLanguage: English Series: Publication details: Cambridge ; Cambridge University Press ; 2007Edition: Description: xi,395 p; 25.5 cmISBN: 978-0-521-83199-4Subject(s): | Material Testing | Focused ion beams , Focused ion beams-Industrial applications , Ion bombardment
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Books Books Central Library, IITB
620.168:537.533.72Foc Checked out to Dr. Rakesh G Mote (I14079) 03/01/2025 217968
Total holds: 0

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