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Rational fault analysis / edited by Richard Saeks and Stanley R. Liberty

by | .

Series: Edition: Language: English Publication details: New York ; Marcel Dekker, ; 1977Availability: Items available for loan: 1 Call number: 621.317.33 Rat:74(2).

Electronic testing and troubleshooting

by Loveday, George | .

Series: Edition: Language: English Publication details: New York ; John Wiley, ; 1982Availability: Items available for loan: 1 Call number: 621.317.39:621.38 Lov.

Digital test engineering

by Cortner, J. Max | .

Series: Edition: Language: English Publication details: New York ; John Wiley, ; 1987Availability: Items available for loan: 1 Call number: 621.317.2 Cor.

Diagnosis and reliable design of digital systems

by Breuer, Melvin A | Friedman, Arthur D | .

Series: Student mathematical library ; v.26Edition: Language: English Publication details: Woodland Hills ; Computer Science Press, ; 1976Availability: Items available for loan: 1 Call number: 621.374.32:681.3 Bre.

Rational fault analysis / edited by Richard Saeks and Stanley R, Liberty

by | .

Series: Lecture notes in computer science ; v.2709Edition: Language: English Publication details: New York ; Marcel Dekker, ; 1977Availability: Items available for loan: 1 Call number: 621.317.33 Rat:74.

Electronic testing / compiled and edited by L.L. Farkas

by | .

Series: Edition: Language: English Publication details: New York ; McGraw-Hill Book, ; 1966Availability: Items available for loan: 1 Call number: 621.317 Ele.

Handbook of basic electronic troubleshooting (R)

by Lenk, John D | .

Series: Edition: Language: English Publication details: Englewood Cliffs ; Prentice-Hall ; 1977Availability: Items available for loan: 1 Call number: 621.38.004.5(083)Len.

RF comb generator (R)

by Sanan, Rajeev | Girish Kumar.

Series: Edition: Language: English Publication details: Mumbai ; IIT ; 2011Availability: Items available for reference: Not for loan (1) Call number: 043:621.317.7San.

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