Microwave dielectric characterization of unpatterned thin films using a TeoYv mode dielectric resonator technique : theory
Language: English Series: NIST TN 1526 : 2002Publication details: Washington, D.C. ; National Institute of Standards and Technology ; 2002Edition: Description: 40 p; ISBN: Subject(s): | Dielectric constant-resonator, Microwave measurements, Resonance, SubstrateOnline resources: Click here to access online| Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
Pamphlets Standards Reports
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Central Library, IITB | LNIST TN 1526 : 2002 | Not for loan | A65737 |
Total holds: 0
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